Semiconductor
Group Testing
As RF systems for electronics and communication becomes more complex, if one of them fails, the entire RF system will fail. Although traditional piece-by-piece testing can find faulty equipment, it wastes lots of time, therefore, to speed up the testing process, a solution that does not affect the accuracy and can be tested quickly and even automatically calibrated is needed. Therefore, our Group Testing for phased array antenna, RF chip or RF module is so valued in the industry!
How is our Group Testing different?
As for the traditional testing for S-parameters, it switches the RF components on the carrier board sequentially. But it wastes much time and inefficient when more components are needed to be tested.
The Group Measurement is a basic configuration to test multiple RF devices (chips or modules) in one program. Quadrature domains are generated for each RF path by exploiting the fast phase-shifting property of a digital phase shifter (DPS). It reduces the testing time of RF devices to the millisecond level and only requires one set of RF testing equipment (Table 5). Our Group Measurement can complete all relevant testing in seconds and be applied to AiP and RF chips/modules in addition to array antennas.
The Group Measurement is a basic configuration to test multiple RF devices (chips or modules) in one program. Quadrature domains are generated for each RF path by exploiting the fast phase-shifting property of a digital phase shifter (DPS). It reduces the testing time of RF devices to the millisecond level and only requires one set of RF testing equipment (Table 5). Our Group Measurement can complete all relevant testing in seconds and be applied to AiP and RF chips/modules in addition to array antennas.