OHM+Fast-GT-S RFIC Tester | Multi-sites Group Testing

OHM+Fast-GT-S RFIC Tester | Multi-sites Group Testing

Scalable
  • Quad site based Group testing scales up to 16 sites
  • Backward compatible to sub-8GHz and mm-wave
Group EVM, ACPR,HMM and Gain Testing
  • Error Vector Magnitude (EVM) measurement accuracy down to -51 dB 
  • World fastest EVM measurement speed saving over 40%  
Universal RF Ports & Waveform Generator
  • Test head resident port modules provide SMA female connector, operating between 380 MHz and 12 GHz
  • 512 MSa of IQ data 
VNA
  • Single shut high accuracy full S-parameter group testing
Digitizer
  •  16 bidirectional channels per module, up to 12 modules can be synchronized (192 channels) 
  •  Programmable logic levels: -1.5V to +6.5V
  • Up to 250MHz pattern rate with RZ support for clock generation
  • Independent signal waveform definitions for arbitrary per bit patterns 
  • Independent channels: per channel & per clock cycle IO control, per vector timing, per period timing, on-the-fly modification 1ns
  • Per channel programmable stimulus/response compensation delay
  • Up to 125M vectors per channel memory
Analysis Bandwidth
380 to 550 MHz
200 MHz
550 MHz to 1.31 GHz
600 MHz
1.31 to 12 GHz
1.2 GHz

 

Chassis Specifications
Specifications @RT 25°C
Shell (L x W x H)800 x 800 x 1016mm ±10%
Overall (L x W x H)960 x 850 x 1160mm ±10%
Weight150 kg±10%
Adjusted Height14 mm
Load Board Size (L₁ x W₂)300 x 300 mm

 

 

Chassis Structures
Module   Description
1Test Jig Module  
2PXI Chassis* 
33U Bracket Module 
4Switch module
 (with power, plugs, USB, etc.)
 
*PXI Chassis: NI, Keysight , etc.