OHM+Fast-GT-S RFIC Tester | Multi-sites Group Testing
Features
- The best alternative for semiconductor testing system in mass production
- To build a complete ATE, suitable for RF, mixed signal, MEMS semiconductor devices.
- To provide modular software libraries to develop, debug, and deploy testing programs quickly
- To assist in customizing STS configurations, testing programs and load boards to integrate with the existing testing production lines.
- To improve efficiency, save field space, and reduce production cost.
Scalable
- Quad site based Group testing scales up to 16 sites
- Backward compatible to sub-8GHz and mm-wave
Group EVM, ACPR,HMM and Gain Testing
- Error Vector Magnitude (EVM) measurement accuracy down to -51 dB
- World fastest EVM measurement speed saving over 40%
Universal RF Ports & Waveform Generator
- Test head resident port modules provide SMA female connector, operating between 380 MHz and 12 GHz
- 512 MSa of IQ data
VNA
- Single shut high accuracy full S-parameter group testing
Digitizer
- 16 bidirectional channels per module, up to 12 modules can be synchronized (192 channels)
- Programmable logic levels: -1.5V to +6.5V
- Up to 250MHz pattern rate with RZ support for clock generation
- Independent signal waveform definitions for arbitrary per bit patterns
- Independent channels: per channel & per clock cycle IO control, per vector timing, per period timing, on-the-fly modification 1ns
- Per channel programmable stimulus/response compensation delay
- Up to 125M vectors per channel memory
| Analysis Bandwidth | 380 to 550 MHz 200 MHz 550 MHz to 1.31 GHz 600 MHz 1.31 to 12 GHz 1.2 GHz
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